Clustering and variance maps for cryo-electron tomography using wedge-masked differences

Journal of Structural Biology

Volumn 175, Issue 3, 2011, Pages 288-299

  Heumann, John M ^a   Hoenger, Andreas ^a   Mastronarde, David N ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

Electron microscopy; Image processing; Missing data missing wedge; Multivariate statistical analysis; Principal component analysis

Indexed keywords

ARTICLE; DATA ANALYSIS; ELECTRON TOMOGRAPHY; IMAGE PROCESSING; IMAGE RECONSTRUCTION; PRINCIPAL COMPONENT ANALYSIS; PRIORITY JOURNAL; SIGNAL NOISE RATIO;

CRYOELECTRON MICROSCOPY; ELECTRON MICROSCOPE TOMOGRAPHY; PRINCIPAL COMPONENT ANALYSIS;

EID: 79960900012     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2011.05.011     Document Type: Article

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