Hierarchically distributed fault detection and identification through Dempster-Shafer evidence fusion

Industrial and Engineering Chemistry Research

Volumn 50, Issue 15, 2011, Pages 9249-9269

  Ghosh, Kaushik ^a   Natarajan, Sathish ^a   Srinivasan, Rajagopalan ^a,b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF CHEMICAL AND ENGINEERING SCIENCES   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL PROCESS; COLUMN SYSTEMS; DEMPSTER SHAFER EVIDENCE THEORY; DEMPSTER-SHAFER; DIAGNOSTIC PERFORMANCE; EVIDENCE FUSION; FAULT CLASS; FAULT DETECTION AND IDENTIFICATION; FDI METHOD; LEVELS OF ABSTRACTION; MONITORING STRATEGY; PROCESS FLOW DIAGRAMS; SHEER SIZE; TENNESSEE EASTMAN CHALLENGE;

CHEMICAL DETECTION; DISTILLATION; DISTILLATION COLUMNS;

FAULT DETECTION;

EID: 79960878195     PISSN: 08885885     EISSN: 15205045     Source Type: Journal    
DOI: 10.1021/ie2003329     Document Type: Article

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