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Physica Status Solidi (B) Basic Research

Volumn 248, Issue 8, 2011, Pages 1949-1955

Nickel-related defects in ZnO - A deep-level transient spectroscopy and photo-capacitance study

(9) Schmidt, Matthias a,b Brachwitz, Kerstin a Schmidt, Florian a Ellguth, Martin a von Wenckstern, Holger a Pickenhain, Rainer a Grundmann, Marius a Brauer, Gerhard b Skorupa, Wolfgang b

a UNIVERSITY OF LEIPZIG (Germany)

b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH (Germany)

Author keywords

Capacitance; Deep level; DLTS; Ion implantation; Nickel; Photo capacitance; Zinc oxide; ZnO

Indexed keywords

EID: 79960870083 PISSN: 03701972 EISSN: 15213951 Source Type: Journal
DOI: 10.1002/pssb.201046634 Document Type: Article

Times cited : (6)

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