Solution for the critical thickness models of dislocation generation in epitaxial thin films using the Lambert W function

Journal of Materials Science

Volumn 46, Issue 6, 2011, Pages 1913-1915

  Hadj Belgacem, Chokri ^a   Fnaiech, Mustapha ^a  

^a FACULTÉ DES SCIENCES DE MONASTIR   (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL SOLUTIONS; CRITICAL THICKNESS; DISLOCATION GENERATION; EPITAXIAL THIN FILMS; EXACT ANALYTICAL SOLUTIONS; ITERATIVE COMPUTATION; LAMBERT W FUNCTION; MISFIT STRAINS; NUMERICAL SOLUTION;

EPITAXIAL GROWTH; TUNGSTEN COMPOUNDS;

EPITAXIAL FILMS;

EID: 79960837614     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-010-5026-y     Document Type: Article

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