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Volumn 8077, Issue , 2011, Pages

Handling the carbon contamination issue at SOLEIL

Author keywords

Carbon contamination; Cleaning process; Oxygen plasma; VUV and XUV optics damages

Indexed keywords

BEAM-LINES; CARBON COATING; CARBON CONTAMINATION; CARBON K-EDGE; CARBON LAYERS; CLEANING PROCESS; IN-SITU; LOW ENERGIES; OPTICAL COMPONENTS; OPTICAL PERFORMANCE; OXYGEN PLASMA; OXYGEN PLASMAS; OZONE GENERATION; PHOTON BEAMS; SOFT X-RAY RANGE; TRANSMISSION RATIOS; VUV AND XUV;

EID: 79960542609     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.886970     Document Type: Conference Paper
Times cited : (11)

References (11)
  • 1
    • 79960481857 scopus 로고    scopus 로고
    • http://www.synchrotron-soleil.fr/Recherche/LignesLumiere/TEMPO
  • 2
    • 79960523159 scopus 로고    scopus 로고
    • http://www.synchrotron-soleil.fr/portal/page/portal/Recherche/ LignesLumiere/DESIRS
  • 8
    • 1442282641 scopus 로고    scopus 로고
    • SU5: A calibrated variable-polarization synchrotron radiation beam line in the vacuumultraviolet range
    • L. Nahon, and C. Alcaraz, "SU5: a calibrated variable-polarization synchrotron radiation beam line in the vacuumultraviolet range," Applied Optics 43, 1024-1037 (2004).
    • (2004) Applied Optics , vol.43 , pp. 1024-1037
    • Nahon, L.1    Alcaraz, C.2
  • 10
  • 11
    • 57549107686 scopus 로고    scopus 로고
    • Characterization of optical surfaces for the present generations of synchrotron sources
    • art.no 715506
    • Thomasset, M. & Polack, F. "Characterization of optical surfaces for the present generations of synchrotron sources", Proceedings of SPIE, 2008, 7155: art.no 715506.
    • (2008) Proceedings of SPIE , vol.7155
    • Thomasset, M.1    Polack, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.