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Volumn 110, Issue 1, 2011, Pages

Composition and temperature-induced structural evolution in La, Sm, and Dy substituted BiFeO3 epitaxial thin films at morphotropic phase boundaries

(4) Kan, Daisuke a,b Cheng, Ching Jung c Nagarajan, Valanoor c Takeuchi, Ichiro a

a UNIVERSITY OF MARYLAND (United States)

b KYOTO UNIVERSITY (Japan)

c UNIVERSITY OF NEW SOUTH WALES (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL THIN FILMS; FIELD-INDUCED TRANSITIONS; FUNCTIONAL PROPERTIES; IONIC RADIUS; IONIC SIZES; MORPHOTROPIC PHASE BOUNDARIES; ORTHORHOMBIC PHASE; RE ELEMENTS; RHOMBOHEDRAL PHASE; SRTIO; STRUCTURAL BOUNDARY; STRUCTURAL EVOLUTION; STRUCTURAL INVESTIGATION; STRUCTURAL PHASE TRANSITION; STRUCTURAL PHASIS; TEMPERATURE-INDUCED; THIN FILM MATERIAL; UNIT CELLS; UNIT-CELL DIMENSIONS;

BISMUTH; EPITAXIAL FILMS; EPITAXIAL GROWTH; HYSTERESIS; HYSTERESIS LOOPS; IONIC CONDUCTION IN SOLIDS; IRON OXIDES; PHASE DIAGRAMS; X RAY DIFFRACTION;

LANTHANUM;

EID: 79960499314 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3605492 Document Type: Article

Times cited : (52)

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