Ion beam (RBS) and XRF analysis of metal contacts deposited on CdZnTe and CdTe crystals

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2010, Pages 3678-3682

  Raulo, Adelaide ^a   Marchini, Laura ^a   Paternoster, Giovanni ^a   Perillo, Eugenio ^a   Paiano, Pasquale ^a   Mancini, Anna Maria ^a   Zha, Mingzheng ^a   Zappettini, Andrea ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CDTE CRYSTALS; COMPLEX PROFILES; CONCENTRATION PROFILES; ELECTRICAL QUALITY; ELECTROLESS TECHNIQUE; INTERFACE LAYER; METAL CONTACTS; RUTHERFORD BACKSCATTERING SPECTROMETRY; SURFACE LAYERS; X RAY FLUORESCENCE; X RAY GENERATORS; XRF ANALYSIS;

CADMIUM; CADMIUM ALLOYS; CRYSTALS; GAMMA RAYS; GOLD COATINGS; INTERFACES (MATERIALS); MEDICAL IMAGING; NUCLEAR PHYSICS; PALLADIUM; PLATINUM; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STOICHIOMETRY; TELLURIUM; THERMAL EVAPORATION; X RAYS;

CADMIUM COMPOUNDS;

EID: 79960323799     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2010.5874499     Document Type: Conference Paper

References (10)

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