Determining the electron-phonon coupling strength from Resonant Inelastic X-ray Scattering at transition metal L-edges

EPL

Volumn 95, Issue 2, 2011, Pages

  Ament, L J P ^a,b   Van Veenendaal, M ^c,d   Van Den Brink, J ^b  

^a UNIVERSITEIT LEIDEN   (Netherlands)

^b Institute for Theoretical Solid State Physics   (Germany)

^c NORTHERN ILLINOIS UNIVERSITY   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79960187172     PISSN: 02955075     EISSN: 12864854     Source Type: Journal    
DOI: 10.1209/0295-5075/95/27008     Document Type: Article

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