Observation of phonons with resonant inelastic x-ray scattering

Journal of Physics Condensed Matter

Volumn 22, Issue 48, 2010, Pages

  Yavas H ^a,b,j   Van Veenendaal, M ^a,c   Van Den Brink, J ^e   Ament, L J P ^d   Alatas, A ^a   Leu, B M ^a   Apostu, M O ^f   Wizent, N ^g,h   Behr, G ^g   Sturhahn, W ^a,k   Sinn, H ⁱ   Alp, E E ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c NORTHERN ILLINOIS UNIVERSITY   (United States)

^d UNIVERSITEIT LEIDEN   (Netherlands)

^e Institute for Theoretical Solid State Physics   (Germany)

^f ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^g IFW DRESDEN   (Germany)

^h UNIVERSITY OF HEIDELBERG   (Germany)

ⁱ EUROPEAN XFEL GMBH   (Germany)

^j DESY   (Germany)

^k CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

CU K-EDGE; CUPRIC OXIDE; DEGREES OF FREEDOM; ELECTRON-PHONON COUPLING STRENGTHS; EXACT DIAGONALIZATION; QUANTUM MECHANICAL; RESONANT INELASTIC X-RAY SCATTERING; SHORT CORE; SPECTRAL INTENSITY; THERMAL AND ELECTRIC PROPERTIES;

ELECTRIC PROPERTIES; LATTICE VIBRATIONS; MATERIALS PROPERTIES; MECHANICAL PROPERTIES; QUANTUM THEORY; SCATTERING; VIBRATIONS (MECHANICAL); X RAY SCATTERING;

PHONONS;

EID: 78649850292     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/48/485601     Document Type: Article

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