SCOPUS 정보 검색 플랫폼

Vacuum

Volumn 86, Issue 1, 2011, Pages 18-22

Chemical-state information obtained by AES and XPS from thin oxide layers on duplex stainless steel surfaces

(2) Mandrino, Dj a Donik, C a

a INSTITUTE OF METALS AND TECHNOLOGY (Slovenia)

Author keywords

AES; Chemical state; Duplex stainless steel; Oxide layers; XPS

Indexed keywords

AES; CHEMICAL STATE; DUPLEX STAINLESS STEEL; HOMOGENEOUS LAYERS; LANGMUIRS; LINEAR LEAST SQUARES; METALLIC SUBSTRATE; METALLIC SURFACE; OXIDE LAYER; OXIDE LAYERS; PEAK SHAPES; POLISHED SUBSTRATES; THIN OXIDE FILMS; THIN OXIDE LAYERS;

CHROMIUM; CORROSION RESISTANT ALLOYS; METALLIC COMPOUNDS; OXIDE FILMS; STEEL CORROSION; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

STAINLESS STEEL;

EID: 79960172469 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/j.vacuum.2011.03.025 Document Type: Article

Times cited : (21)

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