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Volumn 252, Issue 4, 2005, Pages 1076-1083

An XPS study of CrO x on a thin alumina film and in alumina supported catalysts

Author keywords

Catalyst; Chromium oxide; X ray photoelectron spectroscopy

Indexed keywords

ALUMINA; CATALYSTS; MATHEMATICAL MODELS; OXIDATION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 26444552201     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.02.029     Document Type: Article
Times cited : (39)

References (28)
  • 20
    • 0000014708 scopus 로고
    • Data analysis in XPS and AES
    • D. Briggs M.P. Seah Practical Surface Analysis, second ed. John Wiley & Sons, Inc.
    • P.M.A. Sherwood Data analysis in XPS and AES D. Briggs M.P. Seah Practical Surface Analysis second ed. Auger and X-ray Photoelectron Spectroscopy Vol. 1 1990 John Wiley & Sons, Inc. 555 586
    • (1990) Auger and X-ray Photoelectron Spectroscopy , vol.1 , pp. 555-586
    • Sherwood, P.M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.