A phase-field model for polycrystalline thin film growth

Journal of Crystal Growth

Volumn 327, Issue 1, 2011, Pages 189-201

  Wendler, Frank ^a   Mennerich, Christian ^a   Nestler, Britta ^a  

^a KARLSRUHE UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

A1. Phase field modelling; A2. Hydrothermal crystal growth; A3. Polycrystalline deposition; B1. Zeolite films

Indexed keywords

ANISOTROPIC INTERFACES; AVERAGE GRAIN DIAMETER; B1. ZEOLITE FILMS; COMPETITIVE GROWTH; DIFFUSE INTERFACE MODELS; ENERGY SCALE; FIBRE TEXTURE; FLAT SUBSTRATES; GINZBURG-LANDAU FREE ENERGY; GRAIN ORIENTATION; GROWTH VELOCITY; HYDROTHERMAL CRYSTAL GROWTH; HYDROTHERMALLY; INTERFACE ENERGY; KINETIC COEFFICIENT; LIQUID PHASE; MFI ZEOLITE; MODEL PARAMETERS; ORDER PARAMETER; ORIENTATION DISTRIBUTIONS; PHASE FIELDS; PHASE-FIELD MODELS; PHYSICAL DATA; POLY CRYSTALLINE DEPOSITION; POLYCRYSTALLINE; POLYCRYSTALLINE THIN FILM GROWTH; RANDOMLY DISTRIBUTED; SEED CRYSTAL; SIMPLIFYING ASSUMPTIONS; SOLID GRAINS; SOLID-LIQUID INTERFACES; STRUCTURE EVOLUTION; TEMPORAL EVOLUTION; THREE DIMENSIONS; TRIPLE JUNCTION; ZEOLITE THIN FILM;

ANISOTROPY; COMPUTER SIMULATION; CRYSTAL GROWTH; GRAIN BOUNDARIES; GRAIN GROWTH; PHASE INTERFACES; SILICATE MINERALS; SPHERES; THIN FILMS; VAPOR DEPOSITION;

FILM GROWTH;

EID: 79960169781     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2011.04.044     Document Type: Article

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