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Volumn 115, Issue 27, 2011, Pages 7891-7900

Femtosecond photoelectron imaging of transient electronic states and rydberg atom emission from electronically excited he droplets

Author keywords

[No Author keywords available]

Indexed keywords

EXTREME ULTRAVIOLETS; FEMTOSECOND TIME-RESOLVED; FEMTOSECONDS; FLUORESCENCE EXCITATION; LOCAL DENSITY; PHOTOELECTRON IMAGING; PHOTON ENERGY; RELAXATION CHANNELS; RYDBERG ATOMS; SURFACE REGION; TIME-SCALES; TRANSIENT ELECTRONICS; ULTRAFAST RELAXATION;

EID: 79960142966     PISSN: 10895639     EISSN: 15205215     Source Type: Journal    
DOI: 10.1021/jp2004216     Document Type: Article
Times cited : (44)

References (45)
  • 41
    • 45549087656 scopus 로고    scopus 로고
    • NIST ASD Team; National Institute of Standards and Technology: Gaithersburg, MD, 2010, accessed online June 2, 2011.
    • Ralchenko, Y.; Kramida, A.; Reader, J. NIST ASD Team NIST Atomic Spectra Database; National Institute of Standards and Technology: Gaithersburg, MD, 2010, accessed online June 2, 2011; http://physics.nist.gov/asd3.
    • NIST Atomic Spectra Database
    • Ralchenko, Y.1    Kramida, A.2    Reader, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.