Membrane characterization by microscopic and scattering methods: Multiscale structure

Membranes

Volumn 1, Issue 2, 2011, Pages 91-97

  Tamime, Rahma ^a   Wyart, Yvan ^a   Siozade, Laure ^b   Baudin, Isabelle ^c   Deumie, Carole ^b   Glucina, Karl ^c   Moulin, Philippe ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c CIRSEE   (France)

Author keywords

Atomic force microscopy; Ellipsometry; Membrane; Roughness; White light interferometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; INTERFEROMETRY; PORE SIZE; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS;

ELLIPSOMETRIC MEASUREMENTS; HIGH ANGULAR RESOLUTIONS; MEMBRANE CHARACTERIZATION; MULTI-SCALE STRUCTURES; POLYETHERSULFONE MEMBRANE; SCATTERING METHODS; SCATTERING TECHNIQUES; WHITE-LIGHT INTERFEROMETRY;

MEMBRANES;

EID: 79960124002     PISSN: None     EISSN: 20770375     Source Type: Journal    
DOI: 10.3390/membranes1020091     Document Type: Article

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