Characterization of synthetic membranes by Raman spectroscopy, electron spin resonance, and atomic force microscopy; a review

Polymer

Volumn 41, Issue 5, 2000, Pages 1917-1935

  Khulbe, K C ^a   Matsuura, T ^a  

^a UNIVERSITY OF OTTAWA   (Canada)

Author keywords

Atomic force microscope; Electron spin resonance; Raman scattering

Indexed keywords

ATOMIC FORCE MICROSCOPY; PARAMAGNETIC RESONANCE; RAMAN SPECTROSCOPY;

SYNTHETIC MEMBRANES;

POLYMERIC MEMBRANES;

MACROGOL; POLYETHYLENE; POLYMER;

MEMBRANE; MICROSCOPY; RESONANCE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DIAGNOSTIC VALUE; ELECTRON SPIN RESONANCE; INTERMETHOD COMPARISON; MEMBRANE PERMEABILITY; MEMBRANE STRUCTURE; RAMAN SPECTROMETRY; STRUCTURE ANALYSIS; SURFACE PROPERTY; THERMOSTABILITY;

MEMBRANE; MICROSCOPY; RAMAN SPECTROSCOPY;

EID: 0033971524     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(99)00359-6     Document Type: Article

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