Global-local structure analysis model and its application for fault detection and identification

Industrial and Engineering Chemistry Research

Volumn 50, Issue 11, 2011, Pages 6837-6848

  Zhang, Muguang ^a   Ge, Zhiqiang ^a   Song, Zhihuan ^a   Fu, Ruowei ^a  

^a STATE KEY LABORATORY OF INDUSTRIAL CONTROL TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAYESIAN INFERENCE; DATA SETS; DIMENSION REDUCTION; FAULT DETECTION AND IDENTIFICATION; FAULT IDENTIFICATIONS; GLOBAL DATA; GLOBAL-LOCAL; LOCAL STRUCTURE; LOCALITY PRESERVING PROJECTIONS; OPTIMIZATION FUNCTION; ORTHOGONAL PROPERTY; PCA METHOD; SINGULARITY PROBLEMS; STRUCTURE ANALYSIS; TUNING PARAMETER; UNIFIED FRAMEWORK;

BAYESIAN NETWORKS; IDENTIFICATION (CONTROL SYSTEMS); INFERENCE ENGINES; PRINCIPAL COMPONENT ANALYSIS;

FAULT DETECTION;

EID: 79959985541     PISSN: 08885885     EISSN: 15205045     Source Type: Journal    
DOI: 10.1021/ie102564d     Document Type: Article

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