Imaging of CNTs in a polymer matrix at low accelerating voltages using a SEM

Carbon

Volumn 49, Issue 12, 2011, Pages 3891-3898

  Li, Wenjing ^a   Bauhofer, Wolfgang ^a  

^a HAMBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATING VOLTAGES; EPOXY MATRICES; IMAGING MECHANISM; LOW ACCELERATING VOLTAGE; POSITIVELY CHARGED; PRIMARY ELECTRONS; SCANNING ELECTRON MICROSCOPE; SECONDARY ELECTRONS; YIELD CURVE;

CARBON NANOTUBES; SCANNING ELECTRON MICROSCOPY; VISUALIZATION;

ELECTRONS;

EID: 79959984655     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2011.05.027     Document Type: Article

References (31)

1. J. Loos, A. Alexeev, N. Grossiord, C.E. Koning, and O. Regev Visualization of single-wall carbon nanotube (SWNT) networks in conductive polystyrene nanocomposites by charge contrast imaging Ultramicroscopy 104 2005 160 167 (Pubitemid 40848636)
2. P.T. Lillehei, J. Kim, L.J. Gibbons, and C. Park A quantitative assessment of carbon nanotube dispersion in polymer matrices Nanotechnology 20 2009 325708
3. J.Z. Kovacs, K. Andresen, J.R. Pauls, C.P. Garcia, M. Schossig, and K. Schulte Analyzing the quality of carbon nanotube dispersions in polymers using scanning electron microscopy Carbon 45 2007 1279 1288 (Pubitemid 46635370)
4. A. Noll, and T. Burkhart Morphological characterization and modelling of electrical conductivity of multi-walled carbon nanotube/poly(p-phenylene sulfide) nanocomposites obtained by twin screw extrusion Compos Sci Technol 71 2011 499 505
5. H. Deng, R. Zhang, E. Bilotti, J. Loos, and T. Peijs Conductive polymer tape containing highly oriented Carbon nanofillers J Appl Polym Sci 113 2009 742 751
6. K.T. Chung, J.H. Reisner, and E.R. Campbell Charging phenomena in the scanning electron microscopy of conductor-insulator composites: a tool for composite structural analysis J Appl Phys 54 1983 6099 6112 (Pubitemid 14484164)
7. E.R. Campbell, J.H. Reisner, and K.T. Chung Charging phenomenon in conductor-insulator composites as displayed by the scanning electron microscope J Appl Phys 54 1983 1133 1134 (Pubitemid 13525377)
8. W. Li, S.T. Buschhorn, K. Schulte., and W Bauhofer The imaging mechanism, imaging depth, and parameters influencing the visibility of carbon nanotubes in a polymer matrix using an SEM Carbon 49 2011 1955 1964
9. J. Loos, N. Grossiord, C.E. Koning, and O. Regev On the fate of carbon nanotubes: morphological characterisations Compos Sci Technol 67 2007 783 788 (Pubitemid 46111982)
10. D. Dikin, K. Kohlhaas, G. Dommett, S. Stankovich, and R. Ruoff Scanning electron microscopy methods for analysis of polymer nanocomposites Microsc Microanal 12 2006 674 675 (Pubitemid 44719043)
11. A. Battisti, A.A. Skordos, and I.K. Partridge Monitoring dispersion of carbon nanotubes in a thermosetting polyester resin Compos Sci Technol 69 2009 1516 1520
12. Ackermann J. Manual for the SUPRA (VP) and ULTRA Scanning Electron Microscopes. Carl Zeiss SMT Ltd; 2005. p. 15.
13. G.F. Dionne Origin of secondary-electron-emission yield curve parameters J Appl Phys 46 1975 3347 3351
14. Adamson E. Secondary electron emission coefficient from lexan: the low energy crossover. PhD thesis. Texas Tech University, 1993. p. 1-5
15. K. Kanaya, and H. Kawakatsu Secondary electron emission due to primary and backscattered electrons J Phys D Appl Phys 5 1972 1727 1742
16. Reimer L. Image formation in low voltage scanning electron microscopy. Bellingham: SPIE Press; 1993. p. 71-135.
17. H. Zhang, R. Feng, and K. Ura Utilizing the charging effect in scanning electron microscopy Sci Progr 87 2004 249 268
18. M. Suzuki, K. Kumagai, T. Sekiguchi, A.M. Cassell, T. Saito, and C.Y. Yang Secondary electron emission from freely supported nanowires J Appl Phys 104 2008 114306
19. M. Boubaya, and G. Blaise Charging regime of PMMA studied by secondary electron emission Eur Phys J Appl Phys 37 2007 79 86
20. J.H. Butler, D.C. Joy, G.F. Bradley, and S.J. Krause Low voltage scanning electron microscopy of polymers Polymer 36 1995 1781 1790
21. R.F. Willis, and D.K. Skinner Secondary electron emission yield behaviour of polymers Solid State Commun 13 1973 685 688
22. J. Cazaux A new model of dependence of secondary electron emission yield on primary electron energy for application to polymers J Phys D Appl Phys 38 2005 2433 2441 (Pubitemid 40970519)
23. E.A. Burke Secondary emission from polymers IEEE Trans Nucl Sci 27 1980 1760 1764
24. Y. Kishimoto, T. Hayashi, M. Hashimoto, and T. Ohshima Secondary electron emission from polymers and its application to the flexible channel electron mu1tiplier J Appl Polym Sci 21 1977 2721 2733 (Pubitemid 8551522)
25. B. Gross, and R. Hesse Electron emission from electron-irradiated dielectrics IEEE Trans Diel Electr Insul 26 1991 18 25
26. K. Kanaya, and S. Okayama Penetration and energy-loss theory of electrons in solid targets J Phys D Appl Phys 5 1972 43 58
27. M.K. Alam, P. Yaghoobi, M. Chang, and A. Nojeh Secondary electron yield of multiwalled carbon nanotubes Appl Phys Lett 97 2010 261902
28. G. Blaise, and C.L. Gressu Charging and flashover induced by surface polarization relaxation process J Appl Phys 69 1991 6334 6339
29. C.L. Gressu, and G. Blaise Insulator surface analysis J Electron Spectrosc Relat Phenom 59 1992 73 96
30. C.L. Gressus, and G. Blaise Breakdown phenomena related to trapping/detrapping processes in wide band gap insulators IEEE Trans Diel Electr Insul 27 1992 472 481
31. Z. Dang, L. Wang, Y. Yin, Q. Zhang, and Q. Lei Giant dielectric permittivities in functionalized carbon-nanotube/electroactive-polymer nanocomposites Adv Mater 19 2007 852 857 (Pubitemid 46932817)