Local electronic structure of lithium-doped ZnO films investigated by x-ray absorption near-edge spectroscopy

Journal of Physical Chemistry C

Volumn 115, Issue 20, 2011, Pages 10252-10255

  Tsai, Shu Yi ^a   Hon, Min Hsiung ^a   Lu, Yang Ming ^b  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL UNIVERSITY OF TAINAN   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING LENGTH; ELECTRICAL RESISTANCE MEASUREMENT; EXAFS; GLASS SUBSTRATES; LI ATOMS; LI CONTENT; LITHIUM ATOMS; LOCAL ELECTRONIC STRUCTURES; P-TYPE CONDUCTION; RADIO FREQUENCY MAGNETRON SPUTTERING; SECONDARY PHASE; WURTZITE STRUCTURE; X-RAY ABSORPTION NEAR EDGE SPECTROSCOPY; XRD; ZNO; ZNO FILMS; ZNO THIN FILM;

ABSORPTION SPECTROSCOPY; ELECTRIC PROPERTIES; ELECTRONIC STRUCTURE; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; METALLIC FILMS; OPTICAL FILMS; SEMICONDUCTOR DOPING; SUBSTRATES; THIN FILMS; ZINC; ZINC OXIDE; ZINC SULFIDE;

LITHIUM;

EID: 79959918755     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp200815d     Document Type: Article

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