Generation of reduced dynamic thermal models of electronic systems from time constant spectra of transient temperature responses

Microelectronics Reliability

Volumn 51, Issue 8, 2011, Pages 1351-1355

  Janicki, Marcin ^a   Banaszczyk, Jedrzej ^b   Vermeersch, Bjorn ^b   Mey, Gilbert De ^b   Napieralski, Andrzej ^a  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

^b GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT MODEL; COOLING CONDITIONS; ELECTRONIC SYSTEMS; INTEGRATED POWER AMPLIFIERS; PHYSICAL INTERPRETATION; REDUCED DYNAMICS; SYSTEM TRANSIENTS; THERMAL MODEL; TIME CONSTANTS; TRANSIENT TEMPERATURE RESPONSE;

ELECTRONICS ENGINEERING; POWER AMPLIFIERS; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

MODELS;

EID: 79959886234     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2011.03.028     Document Type: Article

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