Total internal reflection STED microscopy

Optics Express

Volumn 19, Issue 14, 2011, Pages 13351-13357

  Gould, Travis J ^a   Myers, Jordan R ^a   Bewersdorf, Joerg ^a,b  

^a YALE UNIVERSITY SCHOOL OF MEDICINE   (United States)

^b Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; FLUORESCENCE MICROSCOPY; REFRACTIVE INDEX;

FAR-FIELD; FAR-FIELD FLUORESCENCE MICROSCOPY; LATERAL RESOLUTION; LIVE-CELL IMAGING; MICROSCOPY TECHNIQUE; MICROTUBULES; PHOTO-DAMAGE; STIMULATED EMISSION DEPLETION MICROSCOPY; TEST SAMPLES; TOTAL INTERNAL REFLECTIONS;

STIMULATED EMISSION;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; FLUORESCENCE MICROSCOPY; ILLUMINATION; IMAGE ENHANCEMENT; INSTRUMENTATION; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; LIGHTING; MICROSCOPY, FLUORESCENCE; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 79959875903     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.013351     Document Type: Article

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