Scanning confocal total internal reflection fluorescence microscopy by using radial polarization in the illumination system

Applied Optics

Volumn 48, Issue 6, 2009, Pages 1114-1118

  Terakado, Goro ^a   Watanabe, Kouyou ^a   Kano, Hiroshi ^a  

^a MURORAN INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE MICROSCOPY; OPTICAL SYSTEMS; OPTICAL TRANSFER FUNCTION; POLARIZATION; REFRACTIVE INDEX;

BACKGROUND NOISE; CONFOCAL DETECTIONS; FLUORESCENT PARTICLE; ILLUMINATION SYSTEM; IMAGING PROPERTIES; RADIAL POLARIZATION; TOTAL INTERNAL REFLECTION FLUORESCENCE; TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY;

FLUORESCENCE;

EID: 61449216154     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.001114     Document Type: Article

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