Coverage guided systematic concurrency testing

Proceedings - International Conference on Software Engineering

Volumn , Issue , 2011, Pages 221-230

  Wang, Chao ^a   Said, Mahmoud ^b   Gupta, Aarti ^a  

^a NEC LABORATORIES AMERICA   (United States)

^b WESTERN MICHIGAN UNIVERSITY   (United States)

Author keywords

concurrency; coverage; partial order reduction

Indexed keywords

CONCURRENCY; COVERAGE; DYNAMIC INFORMATION; INTERLEAVINGS; LIKELY INVARIANTS; MULTI-THREADED PROGRAMS; MULTITHREADED; NUMBER OF THREADS; ORDERING CONSTRAINTS; PARTIAL ORDER REDUCTIONS; PUBLIC DOMAINS; SHARED MEMORIES; SHARED OBJECTS; SYSTEMATIC TESTING; TEST EXECUTION; TEST RUNS; TWO-COMPONENT;

PROGRAM DEBUGGING; RISK MANAGEMENT; RISK PERCEPTION; SOFTWARE ENGINEERING;

SOFTWARE TESTING;

EID: 79959860491     PISSN: 02705257     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1985793.1985824     Document Type: Conference Paper

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