CTrigger: Exposing atomicity violation bugs from their hiding places

ACM SIGPLAN Notices

Volumn 44, Issue 3, 2009, Pages 25-36

  Park, Soyeon ^a   Lu, Shan ^a   Zhou, Yuanyuan ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Concurrency bug; Software testing

Indexed keywords

CONCURRENCY BUG; CONCURRENT PROGRAM; CONCURRENT PROGRAM TESTING; CORE MACHINES; FOUR-ORDER; INTERLEAVINGS; LARGE PROGRAMS; MOZILLA; MULTI CORE; OPEN PROBLEMS; REAL-WORLD; STRESS TESTING;

COMPUTER SOFTWARE SELECTION AND EVALUATION; SOFTWARE TESTING; TRACE ANALYSIS;

PROGRAM DEBUGGING;

EID: 67650809032     PISSN: 15232867     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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