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Volumn 134, Issue 23, 2011, Pages
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In situ conductance measurements of copper phthalocyanine thin film growth on sapphire 0001
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Author keywords
[No Author keywords available]
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Indexed keywords
CONDUCTIVE NETWORKS;
COPPER PHTHALOCYANINE;
CURRENT FLOWING;
EX SITU;
FILM CONDUCTANCES;
FILM GROWTH MECHANISM;
IN-SITU;
WETTING LAYER;
CONDUCTIVE MATERIALS;
NITROGEN COMPOUNDS;
ORGANIC POLYMERS;
SAPPHIRE;
SINGLE CRYSTALS;
THIN FILMS;
THREE DIMENSIONAL;
FILM GROWTH;
ALUMINUM OXIDE;
INDOLE DERIVATIVE;
ORGANOMETALLIC COMPOUND;
PHTHALOCYANINE COPPER;
ARTICLE;
ARTIFICIAL MEMBRANE;
CHEMISTRY;
PARTICLE SIZE;
SURFACE PROPERTY;
WETTABILITY;
ALUMINUM OXIDE;
INDOLES;
MEMBRANES, ARTIFICIAL;
ORGANOMETALLIC COMPOUNDS;
PARTICLE SIZE;
SURFACE PROPERTIES;
WETTABILITY;
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EID: 79959696211
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3600065 Document Type: Article |
Times cited : (3)
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References (17)
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