Precision, all-optical measurement of external quantum efficiency in semiconductors

Journal of Applied Physics

Volumn 109, Issue 9, 2011, Pages

  Wang, Chengao ^a   Li, Chia Yeh ^a   Hasselbeck, Michael P ^a   Imangholi, Babak ^a   Sheik Bahae, Mansoor ^a  

^a UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALL-OPTICAL; BACKGROUND ABSORPTION; CRITICAL PERFORMANCE PARAMETERS; EXTERNAL QUANTUM EFFICIENCY; INDEPENDENT MEASUREMENT; LASER INDUCED; MAXIMUM EFFICIENCY; PHOTO-EXCITATIONS; PHOTOLUMINESCENCE MEASUREMENTS; SCANNING LASERS; SEMICONDUCTOR PHOTONIC DEVICES; TEMPERATURE CHANGES; TIME-RESOLVED PHOTOLUMINESCENCE;

EFFICIENCY; OPTICAL DATA PROCESSING; PHOTOLUMINESCENCE; PHOTONIC DEVICES; SEMICONDUCTOR LASERS;

QUANTUM EFFICIENCY;

EID: 79959521373     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3580259     Document Type: Article

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