Degradation in blue-emitting conjugated polymer diodes due to loss of ohmic hole injection

Applied Physics Letters

Volumn 84, Issue 6, 2004, Pages 921-923

  Khan, Rizwan U A ^a,c   Bradley, Donal D C ^a   Webster, Matthew A ^b   Auld, James L ^b   Walker, Alison B ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b University of Bath   (United Kingdom)

^c ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; COMPUTER SIMULATION; DEGRADATION; ELECTRIC PROPERTIES; INTERFACES (MATERIALS); PHOTOCURRENTS; POLYETHYLENES; POLYSTYRENES; TRANSPORT PROPERTIES;

BLUE EMITTING CONJUGATED POLYMER DIODES; DARK INJECTION; ELECTRICAL STRESSING; ELECTROABSORPTION MEASUREMENTS; INTERFACIAL RESISTANCE; OHMIC HOLE INJECTION; TIME-OF-FLIGHT TRANSIENT PHOTOCURRENT MEASUREMENTS;

LIGHT EMITTING DIODES;

EID: 1542284994     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1645982     Document Type: Article

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