Chemomechanical properties and microstructural stability of nanocrystalline Pr-doped ceria: An in situ X-ray diffraction investigation

Solid State Ionics

Volumn 193, Issue 1, 2011, Pages 1-4

  Kuru, Y ^a   Bishop, S R ^a   Kim, J J ^a   Yildiz, B ^a   Tuller, H L ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Chemomechanics; Defect chemistry; Doped ceria; Reduction oxidation

Indexed keywords

CHEMICAL EXPANSION; CHEMOMECHANICS; COARSE-GRAINED; DEFECT CHEMISTRY; DOPED CERIA; IN-SITU; INTERMEDIATE TEMPERATURES; MICRO-STRAIN; MICROSTRUCTURAL STABILITY; NANOCRYSTALLINES; OXIDIZING CONDITIONS; OXYGEN DEFICIENT; PHYSICAL AND CHEMICAL PROPERTIES; POTENTIAL APPLICATIONS; POTENTIAL SOURCES; PR-DOPED CERIA; REDUCTION/OXIDATION; SOLID-STATE ELECTROCHEMICAL DEVICES; THERMAL EXPANSION COEFFICIENTS; WORKING TEMPERATURES;

CERIUM COMPOUNDS; CHEMICAL PROPERTIES; CRYSTALLITE SIZE; DIFFRACTION; NANOCRYSTALLINE POWDERS; SOLID STATE DEVICES; THERMAL EXPANSION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CERIUM;

EID: 79959309814     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2011.04.012     Document Type: Article

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