Volumetric spectral analysis of materials using terahertz-tomography techniques

Applied Physics B: Lasers and Optics

Volumn 100, Issue 1, 2010, Pages 151-158

  Brahm, A ^a,c   Kunz, M ^a,b   Riehemann, S ^a   Notni, G ^a   Tunnermann A ^a,c  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMOUNT OF INFORMATION; CHARACTERISTIC ABSORPTION; COMPUTED TOMOGRAPHY; INNER STRUCTURE; REFLECTED BEAM; SINGLE CYCLE; TIME-RESOLVED; TIME-RESOLVED DATA;

ELECTRIC FIELD EFFECTS; FAST FOURIER TRANSFORMS; SPECTRUM ANALYSIS; TOMOGRAPHY;

COMPUTERIZED TOMOGRAPHY;

EID: 79959243440     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-010-3945-6     Document Type: Article

References (33)

1. D.M. Mittleman, Sensing with Terahertz Radiation (Springer, Berlin, Heidelberg, 2003)
2. R. Beigang, G. Torosyan, C. Rau, B. Pradarutti, M. Theuer, in Conference on Applied Electromagnetics and Communications, Croatia, 2005
3. J.J. Carey, R.T. Bailey, D. Pugh, J.N. Sherwood, F.R. Cruickshank, K. Wynne, Appl. Phys. Lett. 81, 4335 (2002)
4. M. Rochat, L. Ajili, H. Willenberg, J. Faist, H. Beere, G. Davies, E. Linfield, D. Ritchie, Appl. Phys. Lett. 81, 1381 (2002)
5. M. Tani, M. Herrmann, K. Sakai, Meas. Sci. Technol. 13, 1739 (2002)
6. B. Pradarutti, R. Müller, G. Matthäus, C. Brückner, S. Riehemann, G. Notni, S. Nolte, A. Tünnermann, Opt. Express 15, 17652 (2007)
7. M.C. Nuss, P.C.M. Planken, I. Brener, H.G. Roskos, M.S.C. Luo, S.L. Chuang, Appl. Phys. B 58, 249 (1994)
8. D.H. Auston, K.P. Cheung, J.A. Valdmanis, D.A. Kleinmann, Phys. Rev. Lett. 53, 1555 (1984)
9. B. Pradarutti, G. Matthäus, C. Brückner, S. Riehemann, G. Notni, S. Nolte, A. Tünnermann, Appl. Phys. B 85, 59 (2006)
10. D. Grischkowsky, S. Keiding, M. van Exter, C. Fattinger, J. Opt. Soc. Am. B 7, 2006 (1990)
11. D.M. Mittleman, M. Gupta, R. Neelamani, R.G. Baraniuk, J.V. Rudd, M. Koch, Appl. Phys. B 68, 1085 (1999)
12. B. Ferguson, X.C. Zhang, Nat. Mater. 1, 26 (2002)
13. A.G. Davies, A.D. Burnett, W. Fan, E.H. Linfield, J.E. Cunningham, Mater. Today 11, 18 (2008)
14. B. Pradarutti, G. Matthäus, S. Riehemann, G. Notni, S. Nolte, A. Tünnermann, Opt. Commun. 279, 248 (2007)
15. D.M. Mittleman, S. Hunsche, L. Boivin, M.C. Nuss, Opt. Lett. 22, 904 (1997)
16. B. Ferguson, S. Wang, D. Gray, D. Abbot, X.C. Zhang, Opt. Lett. 27, 1312 (2002)
17. S. Wang, X.-C. Zhang, J. Phys. D: Appl. Phys. 37, 1 (2004)
18. S. Wang, B. Ferguson, D. Abbott, X. Zhang, J. Biol. Phys. 29, 247 (2003)
19. X. Yin, B.W.H. Ng, B. Ferguson, D. Abbott, Digit. Signal Process. 19, 750 (2009)
20. G.N. Hounsfield, J. Comput. Assist. Tomogr. 4, 665 (1980)
21. W. Withayachumnankul, B. Ferguson, T. Rainsford, S.P. Mickan, D. Abbott, Electron. Lett. 41 (2005)
22. L. Duvillaret, F. Garet, J. Coutaz, IEEE J. Sel. Top. Quantum Electron. 2, 739 (1996)
23. J. Radon, Sachs. Ber. Sachs. Wiss. Leipzig Math. Phys. Kl. 69, 262 (1917)
24. S.A. Qureshi, S.M. Mirza, M. Arif, in Student Conference on Engineering Sciences and Technology, Pakistan, 2005
25. A.C. Kak, M. Slaney, Principles of Computerized Tomographic Imaging (IEEE Press, New York, 1988)
26. L.A. Shepp, B.F. Logan, IEEE Trans. Nucl. Sci. 21, 21 (1974)
27. A.L. Cauchy, Oeuvres Complètes: Series 2. Book III (1821), p. 373
28. P. Gu, M. Tani, S. Kono, K. Sakai, X. Zhang, J. Appl. Phys. 91, 5533 (2002)
29. X. Zhang, B.B. Hu, J.T. Darrow, D.H. Auston, Appl. Phys. Lett. 56, 1011 (1990)
30. M.B. Johnston, D.M. Whittaker, A. Corchia, A.G. Davies, E.H. Linfield, Phys. Rev. B 65, 165301-1 (2002)
31. W.A. Kalender, Phys. Med. Biol. 51, 29 (2006)
32. X.C. Zhang, Phys. Med. Biol. 47, 3667 (2002)
33. Y. Wang, Z. Zhao, Z. Chen, L. Zhang, K. Kang, Photonics and optoelectronics meetings. Proc. SPIE 7277, 72770R1 (2008)