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Volumn 8078, Issue , 2011, Pages

The SwissFEL facility and its preliminary optics beamline layout

Author keywords

[No Author keywords available]

Indexed keywords

BEAM DEFLECTION; BEAM LINES; BEAM PROPERTIES; DAMAGE THRESHOLD; FOURTH GENERATION; GERMANY; MATERIAL CHOICE; NEW SOURCES; OPTICS DESIGN; SCIENTIFIC DISCIPLINE; STANFORD; SWISS LIGHT SOURCES; UNDULATOR BEAMLINES;

EID: 79958235982     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.887162     Document Type: Conference Paper
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.