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Volumn , Issue , 1997, Pages 431-434
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AlGaN/GaN MODFETs with low ohmic contact resistances by source/drain n+ re-growth
a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM ALLOYS;
ALUMINUM GALLIUM NITRIDE;
CONTACT RESISTANCE;
ELECTRIC CONTACTORS;
GALLIUM NITRIDE;
HIGH ELECTRON MOBILITY TRANSISTORS;
III-V SEMICONDUCTORS;
MICROFABRICATION;
OHMIC CONTACTS;
SEMICONDUCTOR ALLOYS;
SILICA;
CONVENTIONAL SCHEMES;
DEEP SUB-MICRON;
DEVICE PERFORMANCE;
E BEAM EVAPORATION;
LOW RESISTANCE;
LOW-OHMIC CONTACT;
MOCVD REACTOR;
SOURCE-DRAIN;
WIDE BAND GAP SEMICONDUCTORS;
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EID: 79957936148
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISCS.1998.711683 Document Type: Conference Paper |
Times cited : (8)
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References (4)
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