Variable-force microscopy for advanced characterization of horizontally aligned carbon nanotubes

Nanotechnology

Volumn 22, Issue 27, 2011, Pages

  Almaqwashi, Ali A ^a   Kevek, Joshua W ^a   Burton, Rachel M ^a   Deborde, Tristan ^a   Minot, Ethan D ^a  

^a OREGON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ALIGNED CARBON NANOTUBES; ALIGNED CNTS; ALIGNED GROWTH; DOUBLE-WALLED; GROWTH MECHANISMS; MONODISPERSITY; OPTIMAL GROWTH; QUARTZ LATTICE; ST-CUT QUARTZ; SUBSTRATE THICKNESS; TEM;

CARBON NANOTUBES; QUARTZ; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 79957798034     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/27/275717     Document Type: Article

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