Extended two-dimensional metal-organic frameworks based on thiolate-copper coordination bonds

Journal of the American Chemical Society

Volumn 133, Issue 20, 2011, Pages 7909-7915

  Walch, Hermann ^a   Dienstmaier, Jürgen ^a   Eder, Georg ^a   Gutzler, Rico ^a   Schlögl, Stefan ^a   Sirtl, Thomas ^d   Das, Kalpataru ^b   Schmittel, Michael ^b   Lackinger, Markus ^a,c,d  

^a UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF SIEGEN   (Germany)

^c DEUTSCHES MUSEUM   (Germany)

^d TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; BOND DISTANCE; COORDINATION BONDS; CU(1 1 1); DENSITY FUNCTIONAL THEORY METHODS; DISORDERED STRUCTURES; INTERMOLECULAR BONDS; LATTICE PARAMETERS; METAL COORDINATION; METAL ORGANIC FRAMEWORK; POROUS NETWORKS; ROOM TEMPERATURE DEPOSITION; SCANNING TUNNELING MICROSCOPY (STM); STRUCTURAL CHANGE; SURFACE MEDIATED REACTION; THERMAL-ANNEALING; TRIGONAL STRUCTURES;

ANNEALING; BENZENE; DENSITY FUNCTIONAL THEORY; METAL ANALYSIS; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACE REACTIONS; TWO DIMENSIONAL;

COORDINATION REACTIONS;

1,3,5 TRIS(4 MERCAPTOPHENYL)BENZENE; AROMATIC COMPOUND; COORDINATION COMPOUND; COPPER; DIMER; METAL ORGANIC FRAMEWORK; SILVER; THIOL DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL BOND; CHEMICAL STRUCTURE; DENSITY FUNCTIONAL THEORY; GAS; GEOMETRY; HIGH TEMPERATURE PROCEDURES; PHYSICAL PARAMETERS; REACTION ANALYSIS; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPY; VACUUM;

EID: 79957716413     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja200661s     Document Type: Article

References (43)

1. Barth, J. V. Annu. Rev. Phys. Chem. 2007, 58, 375-407
2. Stepanow, S.; Lin, N.; Barth, J. V. J. Phys.: Condens. Matter 2008, 20, 184002
3. Stepanow, S.; Lingenfelder, M.; Dmitriev, A.; Spillmann, H.; Delvigne, E.; Lin, N.; Deng, X. B.; Cai, C. Z.; Barth, J. V.; Kern, K. Nat. Mater. 2004, 3, 229-233
4. Barth, J. V.; Weckesser, J.; Lin, N.; Dmitriev, A.; Kern, K. Appl. Phys. A 2003, 76, 645-652
5. Ruben, M.; Rojo, J.; Romero-Salguero, F. J.; Uppadine, L. H.; Lehn, J. M. Angew. Chem., Int. Ed. 2004, 43, 3644-3662
6. Pawin, G.; Wong, K. L.; Kim, D.; Sun, D. Z.; Bartels, L.; Hong, S.; Rahman, T. S.; Carp, R.; Marsella, M. Angew. Chem., Int. Ed. 2008, 47, 8442-8445
7. Matena, M.; Stöhr, M.; Riehm, T.; Bjork, J.; Martens, S.; Dyer, M. S.; Persson, M.; Lobo-Checa, J.; Müller, K.; Enache, M.; Wadepohl, H.; Zegenhagen, J.; Jung, T. A.; Gade, L. H. Chem.-Eur. J. 2010, 16, 2079-2091
8. He, J.; Yang, C.; Xu, Z. T.; Zeller, M.; Hunter, A. D.; Lin, J. H. J. Solid State Chem. 2009, 182, 1821-1826
9. Che, C. M.; Li, C. H.; Chui, S. S. Y.; Roy, V. A. L.; Low, K. H. Chem.-Eur. J. 2008, 14, 2965-2975
10. Lin, N.; Dmitriev, A.; Weckesser, J.; Barth, J. V.; Kern, K. Angew. Chem., Int. Ed. 2002, 41, 4779-4783
11. Perry, C. C.; Haq, S.; Frederick, B. G.; Richardson, N. V. Surf. Sci. 1998, 409, 512-520
12. Dougherty, D. B.; Maksymovych, P.; Yates, J. T. Surf. Sci. 2006, 600, 4484-4491
13. Driver, S. M.; Woodruff, D. P. Surf. Sci. 2000, 457, 11-23
14. Ferral, A.; Paredes-Olivera, P.; Macagno, V. A.; Patrito, E. M. Surf. Sci. 2003, 525, 85-99
15. Keller, H.; Simak, P.; Schrepp, W.; Dembowski, J. Thin Solid Films 1994, 244, 799-805
16. Konopka, M.; Turansky, R.; Dubecky, M.; Marx, D.; Stich, I. J. Phys. Chem. C 2009, 113, 8878-8887
17. Maksymovych, P.; Sorescu, D. C.; Yates, J. T. Phys. Rev. Lett. 2006, 97, 146103
18. Sardar, S. A.; Syed, J. A.; Ikenaga, E.; Yagi, S.; Sekitani, T.; Wada, S.; Taniguchi, M.; Tanaka, K. Nucl. Instrum. Methods Phys. Res., Sect. B 2003, 199, 240-243
19. Di Castro, V.; Bussolotti, F.; Mariani, C. Surf. Sci. 2005, 598, 218-225
20. Wong, K. L.; Lin, X.; Kwon, K. Y.; Pawin, G.; Rao, B. V.; Liu, A.; Bartels, L.; Stolbov, S.; Rahman, T. S. Langmuir 2004, 20, 10928-10934
21. Lin, N.; Payer, D.; Dmitriev, A.; Strunskus, T.; Woll, C.; Barth, J. V.; Kern, K. Angew. Chem., Int. Ed. 2005, 44, 1488-1491
22. Giesen, M. Surf. Sci. 1999, 442, 543-549
23. Giesen, M. Prog. Surf. Sci. 2001, 68, 1-153
24. Griessl, S.; Lackinger, M.; Edelwirth, M.; Hietschold, M.; Heckl, W. M. Single Mol. 2002, 3, 25-31
25. Ruben, M.; Payer, D.; Landa, A.; Comisso, A.; Gattinoni, C.; Lin, N.; Collin, J. P.; Sauvage, J. P.; De Vita, A.; Kern, K. J. Am. Chem. Soc. 2006, 128, 15644-15651
26. Otero, R.; Lukas, M.; Kelly, R. E. A.; Xu, W.; Laegsgaard, E.; Stensgaard, I.; Kantorovich, L. N.; Besenbacher, F. Science 2008, 319, 312-315
27. Kühne, D.; Klappenberger, F.; Decker, R.; Schlickum, U.; Brune, H.; Klyatskaya, S.; Ruben, M.; Barth, J. J. Phys. Chem. C 2009, 113, 17851-17859
28. Stöhr, M.; Wahl, M.; C.H., G.; Riehm, T.; Jung, T. A.; Gade, L. H. Angew. Chem., Int. Ed. 2005, 44, 7394-7398
29. Stöhr, M.; Wahl, M.; Spillmann, H.; Gade, L. H.; Jung, T. A. Small 2007, 3, 1336-1340
30. Miwa, J. A.; Cicoira, F.; Bedwani, S.; Lipton-Duffin, J.; Perepichka, D. F.; Rochefort, A.; Rosei, F. J. Phys. Chem. C 2008, 112, 10214-10221
31. Miwa, J. A.; Cicoira, F.; Lipton-Duffin, J.; Perepichka, D. F.; Santato, C.; Rosei, F. Nanotechnology 2008, 19, 424021
32. Pivetta, M.; Blüm, M.-C.; Patthey, F.; Schneider, W.-D. Angew. Chem., Int. Ed. 2008, 47, 1076-1079
33. Blüm, M.-C.; Cavar, E.; Pivetta, M.; Patthey, F.; Schneider, W.-D. Angew. Chem., Int. Ed. 2005, 44, 5334-5337
34. Tomba, G.; Stengel, M.; Schneider, W.-D.; Baldereschi, A.; De Vita, A. ACS Nano 2010, 4, 7545-7551
35. Voznyy, O.; Dubowski, J. J.; Yates, J. T.; Maksymovych, P. Angew. Chem., Int. Ed. 2009, 131, 12989-12993
36. Steudel, R. Angew. Chem., Int. Ed. Engl. 1975, 14, 655-664
37. Ahte, P.; Palumaa, P.; Tamm, T. J. Phys. Chem. A 2009, 113, 9157-9164
38. Hermann, H. L.; Boche, G.; Schwerdtfeger, P. Chem.-Eur. J. 2001, 7, 5333-5342
39. Marschall, M.; Reichert, J.; Weber-Bargioni, A.; Seufert, K.; Auwärter, W.; Klyatskaya, S.; Zoppellaro, G.; Ruben, M.; Barth, J. V. Nature Chem. 2010, 2, 131-137
40. Kelly, R. E. A.; Lukas, M.; Kantorovich, L. N.; Otero, R.; Xu, W.; Mura, M.; Laegsgaard, E.; Stensgaard, I.; Besenbacher, F. J. Chem. Phys. 2008, 129, 184707
41. Gutzler, R.; Walch, H.; Eder, G.; Kloft, S.; Heckl, W. M.; Lackinger, M. Chem. Commun. 2009, 4456-4458
42. Walch, H.; Gutzler, R.; Sirtl, T.; Eder, G.; Lackinger, M. J. Phys. Chem. C 2010, 114, 12604-12609
43. Zhang, J. M.; Song, X. L.; Zhang, X. J.; Xu, K. W.; Ji, V. Surf. Sci. 2006, 600, 1277-1282