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Journal of Electron Spectroscopy and Related Phenomena

Volumn 184, Issue 3-6, 2011, Pages 323-326

2-Butyne on Si(0 0 1) at room temperature: An XPS and NEXAFS study

(6) Bournel, F a Gallet, J J a Rochet, F a Hennies, F b Silly, M c Sirotti, F c

a Universit Pierre et Marie Curie Paris 6 (France)

b LUND UNIVERSITY (Sweden)

c SYNCHROTRON SOLEIL (France)

Author keywords

2 Butyne; Adsorption; NEXAFS; Si(0 0 1); XPS

Indexed keywords

2-BUTYNE; ADSORPTION MODEL; C-C BONDS; C-H BOND; CHEMICAL BONDINGS; CORE LEVELS; LINEARLY-POLARIZED RADIATIONS; MAIN COMPONENT; METHYL CARBON; NEXAFS; NEXAFS SPECTROSCOPY; PHOTOEMISSION LINES; ROOM TEMPERATURE; SATURATION COVERAGE; SI(0 0 1); SILICON SURFACES; SURFACE STATE; SYNCHROTRON RADIATION PHOTOEMISSION SPECTROSCOPY; UV PHOTOEMISSION; XPS;

ADSORPTION; CHEMICAL BONDS; DIMERS; EMISSION SPECTROSCOPY; LUMINESCENCE OF ORGANIC SOLIDS; MOLECULAR ORBITALS; PHOTOEMISSION; SILICON; SYNCHROTRON RADIATION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 79957622757 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2010.12.026 Document Type: Article

Times cited : (1)

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