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Journal of Electron Spectroscopy and Related Phenomena

Volumn 184, Issue 3-6, 2011, Pages 309-312

Excited electron dynamics of bismuth film grown on Si(1 1 1) surface by interferometric time-resolved two-photon photoemission spectroscopy

(3) Fujimasa, Shuji a Imamura, Masaki b Yasuda, Hidehiro c

a KOBE UNIVERSITY (Japan)

b SAGA UNIVERSITY (Japan)

c OSAKA UNIVERSITY (Japan)

Author keywords

Bismuth; Excited electron dynamics; Time resolved two photon photoemission spectroscopy

Indexed keywords

BI FILMS; BISMUTH FILM; DENSITIES OF STATE; ELECTRON-ELECTRON SCATTERING; ENERGY RELAXATION TIME; EXCITED ELECTRONS; POLYCRYSTALLINE; SCATTERING RATES; SI (1 1 1); SINGLE- AND POLY-CRYSTALLINE; SINGLE-CRYSTALLINE; SINGLE-CRYSTALLINE FILM; SURFACE STATE; TIME-RESOLVED; TWO-PHOTON PHOTOEMISSION;

BISMUTH; CRYSTALLINE MATERIALS; ELECTRONS; EMISSION SPECTROSCOPY; INTERFEROMETRY; LUMINESCENCE OF ORGANIC SOLIDS; PHOTOEMISSION; PHOTONS; RELAXATION TIME;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 79957614608 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2011.01.005 Document Type: Article

Times cited : (1)

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