Growth and angle-resolved photoemission studies of bismuth epitaxial films

Surface Science

Volumn 433, Issue , 1999, Pages 647-651

  Tanaka, A ^a   Hatano, M ^a   Takahashi, K ^a   Sasaki, H ^a   Suzuki, S ^a   Sato, S ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; ELECTRONIC STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; PHOTOEMISSION; SEMICONDUCTING SILICON; SUBSTRATES; SURFACE PHENOMENA; SURFACE STRUCTURE; THIN FILMS;

ANGLE RESOLVED PHOTOEMISSION; BISMUTH EPITAXIAL FILMS; QUANTUM CONFINEMENT EFFECTS;

MOLECULAR BEAM EPITAXY;

EID: 0033353222     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00088-6     Document Type: Article

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