Novel readout circuit architecture for CMOS image sensors minimizing RTS noise

IEEE Electron Device Letters

Volumn 32, Issue 6, 2011, Pages 776-778

  Martin Gonthier, Philippe ^a   Magnan, Pierre ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

CMOS image sensor (CIS); correlated double sampling (CDS); low frequency noise (LFN); noisy pixel reduction; random telegraph signal (RTS) noise

Indexed keywords

CMOS IMAGE SENSOR; CORRELATED DOUBLE SAMPLING; LOW-FREQUENCY NOISE; NOISY PIXELS; RANDOM TELEGRAPH SIGNAL NOISE;

CMOS INTEGRATED CIRCUITS; DIGITAL CAMERAS; IMAGE SENSORS; READOUT SYSTEMS; SENSORS; TELEGRAPH;

PIXELS;

EID: 79957588290     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2011.2127442     Document Type: Article

References (10)

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