Source follower noise limitations in CMOS active pixel sensors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5251, Issue , 2004, Pages 187-195

  Findlater, K M ^a   Vaillant, J M ^b   Baxter, D J ^a   Augier, C ^b   Herault, D ^b   Henderson, R K ^a   Hurwitz, J E D ^a   Grant, L A ^a   Volle, J M ^b  

^a STMicroelectronics Ltd Bristol   (United Kingdom)

^b STMICROELECTRONICS   (France)

Author keywords

Active pixel sensors; Correlated double sampling; Source follower noise

Indexed keywords

CMOS INTEGRATED CIRCUITS; CORRELATION METHODS; OPTIMIZATION; PHOTODIODES; SAMPLING; THERMAL NOISE; TRANSISTORS;

ACTIVE PIXEL SENSORS; CORRELATED DOUBLE SAMPLING (CDS); SOURCE FOLLOWER NOISE;

IMAGE SENSORS;

EID: 1942542459     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.512969     Document Type: Conference Paper

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