Description of current pulses induced by heavy ions in silicon detectors (II)

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 642, Issue 1, 2011, Pages 59-64

  Hamrita, H ^a,b   Parlog M ^c,d   Borderie, B ^a   Lavergne, L ^a   Le Neindre, N ^a,c   Rivet, M F ^a   Barbey, S ^a   Bougault, R ^c   Chabot, M ^a   Chbihi, A ^a   Cussol, D ^c   De Oliveira Santos, F ^a   Edelbruck, P ^a   Frankland, J D ^a   Galichet, E ^a,e   Guinet, D ^f   Lautesse, Ph ^f   Lopez, O ^c   Martinet, G ^a   Orr, N A ^c   Piantelli, S ^a,g   Tillier, J ^c   Politi, G ^h   Rauly, E ^a   Rosato, E ⁱ   Tamain, B ^c   Vient, E ^c   Vigilante, M ⁱ   more..

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^b DIF   (France)

^c UNIVERSITÉ DE CAEN   (France)

^d HORIA HULUBEI NATIONAL INSTITUTE OF PHYSICS AND NUCLEAR ENGINEERING   (Romania)

^e Bioinformatique et Chimie Moléculaire   (France)

^f UNIVERSITÉ LYON 1   (France)

^g UNIVERSITY OF FLORENCE   (Italy)

^h UNIVERSITY OF CATANIA   (Italy)

ⁱ UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

Carrier pair dissociation; Current pulse; Dielectric permittivity; Pulse shape analysis; Silicon detectors

Indexed keywords

ELECTRIC FIELDS; HEAVY IONS; PERMITTIVITY;

CARRIER COLLECTION; CURRENT PULSE; DIELECTRIC PERMITTIVITIES; DIELECTRIC POLARIZATION; ELECTRONS AND HOLES; IONIZING PARTICLES; PAIR DISSOCIATION; PULSE SHAPE ANALYSIS;

SILICON DETECTORS;

EID: 79957463202     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2011.03.053     Document Type: Article

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