A method for non-destructive resistivity mapping in silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 602, Issue 2, 2009, Pages 501-505

  Bardelli, L ^a,b   Poggi, G ^a,b   Pasquali, G ^a,b   Bini, M ^a,b  

^a UNIVERSITY OF FLORENCE   (Italy)

^b INFN SEZIONE DI FIRENZE   (Italy)

Author keywords

Digital sampling; Pulse shape analysis; Silicon resistivity; Solid state detectors

Indexed keywords

INVERSE KINEMATICS; METAL DETECTORS;

ACTUAL EXPERIMENTS; APPLIED VOLTAGES; ARBITRARY SHAPES; CRUCIAL PARAMETERS; DIGITAL PULSE-SHAPE ANALYSIS; DIGITAL SAMPLING; NON UNIFORMITIES; NON-DESTRUCTIVE; PULSE-SHAPE ANALYSIS; RESISTIVITY MAPPINGS; RESISTIVITY MEASUREMENTS; RISE TIME; SILICON RESISTIVITY; SOLID STATE DETECTORS;

SILICON DETECTORS;

EID: 63149123569     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.01.033     Document Type: Article

References (11)

1. Pausch G., et al. IEEE Trans. Nucl. Sci. NS-44 3 (1997)
2. Henari F.Z., et al. Nucl. Instr. and Meth. A 288 (1990) 439
3. Rijken H.A., et al. IEEE Trans. Nucl. Sci. NS-40 4 Part 1-2 (1993) 349
4. Bardelli L., et al. Nucl. Instr. and Meth. A 521 (2004) 480
5. Seibt W., et al. Nucl. Instr. and Meth. 113 (1973) 317
6. Knoll G.F. Radiation Detection and Measurement. third ed. (1999), Wiley, New York
7. Several papers are available in the literature on TCT methods-few of them are: V. Eremin, Nucl. Instr. and Meth. A 372 (1996) 388; D. Menichelli, Nucl. Instr. and Meth. A 476 (2002) 614; J. Fink, Nucl. Instr. and Meth. A 565 (2006) 227.
8. Hamrita H., et al. Nucl. Instr. and Meth. A 531 (2004) 607
9. Pasquali G., et al. Nucl. Instr. and Meth. A 570 (2007) 126
10. Topsil, Application Note "NTD silicon for power electronics".
11. FAZIA project 〈http://fazia.in2p3.fr〉.