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Volumn 7, Issue 11, 2011, Pages 5260-5266

Probing interfacial mobility profiles via the impact of nanoscopic confinement on the strength of the dynamic glass transition

(3) Rotella, Cinzia a Wübbenhorst, Michael a Napolitano, Simone a

a UNIVERSITY OF LEUVEN (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; BULK BEHAVIOR; DIELECTRIC MEASUREMENTS; DIELECTRIC STRENGTHS; DYNAMIC GLASS TRANSITION; GLASS TRANSITION TEMPERATURE; GLASSY DYNAMICS; GYRATION RADII; INTERFACIAL INTERACTION; INTERFACIAL MOBILITY; LENGTH SCALE; METALLIC ELECTRODES; MODEL-BASED; NANOSCOPIC CONFINEMENT; PENETRATION DEPTH; POLYMER SEGMENTS; POLYMER SYSTEMS; SEGMENTAL DYNAMICS; SINGLE POLYMER CHAINS; SUPERCOOLED MELT; TEMPERATURE DEPENDENCE; THICKNESS DEPENDENCE; TIME-SCALES; ULTRATHIN POLYMERS;

ADSORPTION; GLASS; MATHEMATICAL MODELS; POLYMER MELTS;

GLASS TRANSITION;

EID: 79957452471 PISSN: 1744683X EISSN: 17446848 Source Type: Journal
DOI: 10.1039/c1sm05430a Document Type: Article

Times cited : (70)

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