Stress and electric field induced phase transformation phenomena in [0 1 1]-poled PZN-PT single crystals of [1 0 0]-length cut

Sensors and Actuators, A: Physical

Volumn 168, Issue 1, 2011, Pages 112-116

  Shanthi, M ^a   Lin, D H ^b   See, R ^a   Chang, W S ^a,b   Lim, L C ^a,b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b Microfine Materials Technologies P/L   (Singapore)

Author keywords

0 1 1 poled; Electric field; Piezoelectric strain; PZN PT; Stress induced phase transformation

Indexed keywords

[0 1 1]-POLED; AXIAL-COMPRESSIVE STRESS; DEGRADED PROPERTIES; DEVICE DESIGN; FIELD INDUCED; ORTHORHOMBIC STATE; PHASE TRANSFORMATION; PIEZOELECTRIC STRAIN; POLING DIRECTIONS; PZN-PT; STRESS INDUCED PHASE TRANSFORMATIONS;

ELECTRIC FIELDS; PHASE TRANSITIONS;

SINGLE CRYSTALS;

EID: 79956362056     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2011.03.032     Document Type: Article

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