Combined electric field and stress-induced R-O phase transformation in [011]-poled Pb (Mg1/3Nb2/3)O3-(28-32) % PbTiO3 single crystals of [011̄]-length cut

Applied Physics Letters

Volumn 95, Issue 10, 2009, Pages

  Shanthi, M ^a   Lim, L C ^a,b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b Microfine Materials Technologies P/L   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; AXIAL-COMPRESSIVE STRESS; COMBINED EFFECT; PHASE TRANSFORMATION; STRAIN BEHAVIORS; STRESS-INDUCED;

COMPRESSIVE STRESS; ELECTRIC FIELDS; LEAD; NIOBIUM; PHOTOTRANSISTORS; TENSILE STRESS;

SINGLE CRYSTALS;

EID: 70249095543     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3222870     Document Type: Article

References (16)

1. S. -E. Park and T. R. Shrout, J. Appl. Phys. 0021-8979 82, 1804 (1997). 10.1063/1.365983
2. S.-E. Park and T. R. Shrout, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 0885-3010 44, 1140 (1997). 10.1109/58.655639
3. H. Luo, G. Xu, P. Wang, and Z. Yin, Ferroelectrics 0015-0193 231, 97 (1999). 10.1080/00150199908014518
4. R. F. Service, Science 0036-8075 275, 1878 (1997). 10.1126/science.275. 5308.1878 (Pubitemid 27148787)
5. W. Ren, A. J. Masys, G. Yang, and B. K. Mukherjee, J. Phys. D: Appl. Phys. 0022-3727 35, 1550 (2002). 10.1088/0022-3727/35/13/316 (Pubitemid 34789724)
6. K. K. Rajan, J. Jin, W. S. Chang, and L. C. Lim, Jpn. J. Appl. Phys., Part 1 0021-4922 46, 681 (2007). 10.1143/JJAP.46.681 (Pubitemid 47252901)
7. M. Shanthi, S. M. Chia, and L. C. Lim, Appl. Phys. Lett. 0003-6951 87, 202902 (2005). 10.1063/1.2130716
8. J. Peng, H. S. Luo, H. Xu, T. He, and W. Jin, Appl. Phys. Lett. 0003-6951 85, 6221 (2004). 10.1063/1.1839288 (Pubitemid 40817882)
9. D. Viehland, L. Ewart, and J. Powers, J. Appl. Phys. 0021-8979 90, 2479 (2001). 10.1063/1.1389480 (Pubitemid 33600672)
10. Z. Feng, H. Luo, Y. Guo, T. He, and H. Xu, Solid State Commun. 0038-1098 126, 347 (2003). 10.1016/S0038-1098(03)00136-4
11. A. Amin, E. McLaughlin, H. Robinson, and L. Ewart, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 0885-3010 54, 1090 (2007). 10.1109/TUFFC.2007.362 (Pubitemid 47000319)
12. P. -E. Janolin, B. Dkhil, M. Davis, D. Damjanovic, and N. Setter, Appl. Phys. Lett. 0003-6951 90, 152907 (2007). 10.1063/1.2721856 (Pubitemid 46613759)
13. E. McLaughlin, T. Liu, and C. S. Lynch, Acta Mater. 1359-6454 52, 3849 (2004). 10.1016/j.actamat.2004.04.034
14. L. C. Lim, K. K. Rajan, and J. Jing, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 0885-3010 54, 2474 (2007). 10.1109/TUFFC.2007.562 (Pubitemid 351634290)
15. M. Shanthi and L. C. Lim, " Electric field and stress-induced R-O phase transformation in [011]-poled PMN-(28-32)%PT single crystals of [100]-length cut.," J. Appl. Phys. 0021-8979 (to be published).
16. L. C. Lim, M. Shanthi, K. K. Rajan, and C. Y. H. Lim, J. Cryst. Growth 0022-0248 282, 330 (2005). 10.1016/j.jcrysgro.2005.05.011 (Pubitemid 41085125)