Investigating electro-mechanical signals from collocated piezoelectric wafers for the reference-free damage diagnosis of a plate

Smart Materials and Structures

Volumn 20, Issue 6, 2011, Pages

  Kim, Eun Jin ^a   Kim, Min Koo ^b   Sohn, Hoon ^b   Park, Hyun Woo ^a  

^a Dong A University   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DAMAGE DIAGNOSIS; ELECTRO-MECHANICAL; INPUT VOLTAGE SIGNAL; LAMB WAVE; MODE CONVERSIONS; PIEZOELECTRIC WAFERS; PZT; PZT WAFER; SPECTRAL-ELEMENT SIMULATIONS;

CANTILEVER BEAMS; DAMAGE DETECTION; ELASTIC WAVES; FAST FOURIER TRANSFORMS; PIEZOELECTRICITY; ULTRASONIC WAVES;

SIGNAL PROCESSING;

EID: 79956204940     PISSN: 09641726     EISSN: 1361665X     Source Type: Journal    
DOI: 10.1088/0964-1726/20/6/065001     Document Type: Article

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