Instantaneous reference-free crack detection based on polarization characteristics of piezoelectric materials

Smart Materials and Structures

Volumn 16, Issue 6, 2007, Pages 2375-2387

  Kim, Seung Bum ^a   Sohn, Hoon ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK DETECTION; CRACK INITIATION; DAMAGE DETECTION; DATA STRUCTURES; NUMERICAL METHODS; POLARIZATION;

PIEZOELECTRIC WAFERS; POTENTIALLY DAMAGED CONDITION; PREDETERMINED DECISION BOUNDARY; THIN METAL STRUCTURES;

PIEZOELECTRIC MATERIALS;

EID: 36448981779     PISSN: 09641726     EISSN: 1361665X     Source Type: Journal    
DOI: 10.1088/0964-1726/16/6/042     Document Type: Article

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