Reference-free impedance-based crack detection in plate-like structures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7650, Issue PART 1, 2010, Pages

  Kim, Minkoo ^a   Kim, Eunjin ^b   Park, Hyunwoo ^b   Sohn, Hoon ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Dong A University   (South Korea)

Author keywords

Environmental and operational conditions; Impedance based damage diagnosis; Mode conversion; Reference free technique; Statistical damage classifier; Structural health monitoring

Indexed keywords

DAMAGE DIAGNOSIS; MODE CONVERSION; MODE CONVERSIONS; OPERATIONAL CONDITIONS; REFERENCE-FREE TECHNIQUE;

BIOLOGICAL SYSTEMS; CLASSIFIERS; CRACK DETECTION; DAMAGE DETECTION; HEALTH; PLATES (STRUCTURAL COMPONENTS); SIGNAL DETECTION; STRUCTURES (BUILT OBJECTS);

STRUCTURAL HEALTH MONITORING;

EID: 77953483631     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.848291     Document Type: Conference Paper

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