Fast time-correlated single-photon counting fluorescence lifetime acquisition using a 100 MHz semiconductor excitation source

Measurement Science and Technology

Volumn 22, Issue 6, 2011, Pages

  McLoskey, David ^a   Campbell, David ^a   Allison, Archie ^a   Hungerford, Graham ^a  

^a HORIBA LTD   (Japan)

Author keywords

diode laser; fast decay acquisition; FLIM application; low dead time electronics; time resolved

Indexed keywords

FLUORESCENCE; LASER EXCITATION; PARTICLE BEAMS;

DEAD TIME; EXPONENTIAL DECAYS; FAST DECAY ACQUISITION; FLUORESCENCE LIFETIME IMAGING; FLUORESCENCE LIFETIMES; HIGH REPETITION RATE; TIME-RESOLVED; TIME-RESOLVED FLUORESCENCE;

SEMICONDUCTOR LASERS;

EID: 79956139703     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/6/067001     Document Type: Conference Paper

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