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Volumn 46, Issue 14, 2011, Pages 5009-5015
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Synthesis and characterizations of CdS nanorods by SILAR method: Effect of film thickness
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Author keywords
[No Author keywords available]
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Indexed keywords
CDS FILMS;
CDS NANOROD;
ELECTRICAL CONDUCTIVITY;
ELECTRICAL PROPERTY;
ELECTRICAL RESISTIVITY;
HEXAGONAL CRYSTAL STRUCTURE;
HYDROPHOBIC NATURE;
PHYSICOCHEMICAL PROPERTY;
POLYCRYSTALLINE;
ROOM TEMPERATURE;
SEM AND TEM;
SEMICONDUCTING BEHAVIOR;
SILAR METHOD;
SPHERICAL GRAINS;
SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS;
WATER CONTACT ANGLE;
XRD PATTERNS;
ADSORPTION;
CADMIUM COMPOUNDS;
CADMIUM SULFIDE;
CHEMICAL PROPERTIES;
CONTACT ANGLE;
CRYSTAL STRUCTURE;
ELECTRIC CONDUCTIVITY;
NANORODS;
SEMICONDUCTING FILMS;
SYNTHESIS (CHEMICAL);
FILM THICKNESS;
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EID: 79956119883
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-011-5421-z Document Type: Article |
Times cited : (26)
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References (28)
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