Preparation and characterization of amorphous manganese sulfide thin films by SILAR method

Materials Research Bulletin

Volumn 42, Issue 8, 2007, Pages 1565-1569

  Pathan, H M ^a   Kale, S S ^b   Lokhande, C D ^c   Han, Sung Hwan ^b   Joo, Oh Shim ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b Hanyang University   (South Korea)

^c SHIVAJI UNIVERSITY   (India)

Author keywords

A. Amorphous materials; A. Thin films; C. X ray diffraction; D. Optical properties; D. Surface properties

Indexed keywords

ADSORPTION; AMORPHOUS FILMS; CHARACTERIZATION; ENERGY DISPERSIVE X RAY ANALYSIS; GLASS; LIGHT ABSORPTION; MANGANESE COMPOUNDS; OPTICAL BAND GAPS; SCANNING ELECTRON MICROSCOPY; SURFACE MORPHOLOGY; X RAY DIFFRACTION;

GLASS SUBSTRATES; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION (SILAR) METHOD; WATER ANGLE CONTACT;

THIN FILMS;

EID: 34249316547     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2006.11.017     Document Type: Article

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