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Volumn 81, Issue 9, 2002, Pages 1684-1686

Low-energy electron irradiation of fullerene films formed on Si(111)-(7×7) surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EXCITATION; EXTRACTION VOLTAGE; FILM MORPHOLOGY; FULLERENE FILMS; LONG LASTING; LOW ENERGY ELECTRON IRRADIATION; PROBE TIPS; SCANNING TUNNELING MICROSCOPES; SI (1 1 1);

EID: 79956055643     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1503155     Document Type: Article
Times cited : (7)

References (25)
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    • D. Ugart, Nature (London) 359, 707 (1992). nat NATUAS 0028-0836
    • (1992) Nature (London) , vol.359 , pp. 707
    • Ugart, D.1
  • 15
    • 33744578099 scopus 로고
    • jcr JCRGAE 0022-0248
    • S. Iijima, J. Cryst. Growth 50, 675 (1980). jcr JCRGAE 0022-0248
    • (1980) J. Cryst. Growth , vol.50 , pp. 675
    • Iijima, S.1
  • 18
    • 21544464626 scopus 로고
    • sci SCIEAS 0036-8075
    • H. Kroto, Science 242, 1139 (1988). sci SCIEAS 0036-8075
    • (1988) Science , vol.242 , pp. 1139
    • Kroto, H.1
  • 20
    • 79958185250 scopus 로고    scopus 로고
    • note
    • Density of electron dose was calculated assuming that the diameter of irradiation area corresponds to the probe-tip retraction distance.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.