Simultaneous atomic force microscope and quartz crystal microbalance measurements: Investigation of human plasma fibrinogen adsorption

Applied Physics Letters

Volumn 81, Issue 7, 2002, Pages 1335-1337

  Choi, K H ^a   Friedt, J M ^a   Frederix, F ^a   Campitelli, A ^a   Borghs, G ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBED LAYERS; AFM; AFM IMAGE; ATOMIC FORCE MICROSCOPES; DIFFERENT SCALE; HUMAN PLASMA FIBRINOGENS; METALLIC SURFACE; MOLECULAR RESOLUTION; PROTEIN ADSORPTION; QUALITATIVE INFORMATION; RESONANCE FREQUENCY SHIFT; SENSING AREAS; SIMULTANEOUS MEASUREMENT; SURFACE CHANGES; TAPPING MODES;

ADSORPTION; ATOMIC FORCE MICROSCOPY; PLASMA (HUMAN); PLASMA DIAGNOSTICS; QUARTZ;

QUARTZ CRYSTAL MICROBALANCES;

EID: 79956055325     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1500777     Document Type: Article

References (20)

1. Surface Characterization: A User's Sourcebook, edited by H. Brune (Wiley, Weinheim, 1997).
2. J. Homola, S. S. Yee, and G. Gauglitz, Sens. Actuators B 54, 3 (1999). sbc SABCEB 0925-4005
3. Application of Piezoelectric Quartz Crystal Microbalances, edited by C. Lu and A. W. Czanderna (Elsevier, Amsterdam, 1984).
4. M. Murasugu, F. Ohta, Y. Miya, T. Hosokawa, S. Kurosawa, N. Kamo, and H. Ikeda, Anal. Chem. 65, 2933 (1993). anc ANCHAM 0003-2700
5. Z. Lin and M. D. Ward, Anal. Chem. 67, 685 (1995). anc ANCHAM 0003-2700
6. J. M. Kim, S. M. Chang, and H. Muramatsu, Appl. Phys. Lett. 74, 466 (1999). apl APPLAB 0003-6951
7. A. Laschitsch and D. Johannsmann, J. Appl. Phys. 85, 3759 (1999). jap JAPIAU 0021-8979
8. C. M. Flanigan, M. Desai, and K. R. Shull, Langmuir 16, 9825 (2000). lan LANGD5 0743-7463
9. M. Rodahl, F. Höök, A. Krozer, P. Brzezinski, and B. Kasemo, Rev. Sci. Instrum. 66, 3924 (1995). rsi RSINAK 0034-6748
10. F. Höök, M. Rodahl-M, C. Keller, K. Glasmästar, C. Fredriksson, P. Dahiqvist, and B. Kasemo, in Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the IEEE International Frequency Conference (IEEE, Piscataway, NJ, 1999), pp. 966-72.
11. A. Janshoff, H. J. Galla, and C. Steinem, Angew. Chem. Int. Ed. Engl. 39, 4004 (2000). aci ACIEAY 0570-0833
12. B. Drake, C. B. Prater, A. L. Weisenhorn, S. A. C. Gould, T. R. Albrecht, C. F. Quate, D. S. Cannell, H. G. Hansma, and P. K. Hansma, Science 243, 1586 (1989). sci SCIEAS 0036-8075
13. Y. F. Dufrene, T. G. Marchal, and P. G. Rouxhet, Langmuir 15, 2871 (1999). lan LANGD5 0743-7463
14. K. D. Jandt, Surf. Sci. 491, 303 (2001). sus SUSCAS 0039-6028
15. P. Cacciafesta, K. R. Hallam, A. C. Watkinson, G. C. Allen, M. J. Miles, and K. D. Jandt, Surf. Sci. 491, 405 (2001). sus SUSCAS 0039-6028
16. P. S. Sit and R. E. Marchant, Surf. Sci. 491, 421 (2001). sus SUSCAS 0039-6028
17. C. F. Wertz and M. M. Santore, Langmuir 18, 706 (2002). lan LANGD5 0743-7463
18. J.-M. Friedt, K.-H. Choi, L. Francis, and A. Campitelli, Jpn. J. Appl. Phys., Part 1 41, 3974 (2002). jjb JAPNDE 0021-4922
19. P. Cacciafesta, A. D. L. Humphris, K. D. Jandt, and M. J. Miles, Langmuir 16, 8167 (2000). lan LANGD5 0743-7463
20. R. Schumacher, G. Borges, and K. K. Kanazawa, Surf. Sci. 163, L621 (1985). sus SUSCAS 0039-6028